首页> 外国专利> DRAWING SHIFT MEASURING METHOD, EXPOSURE METHOD, GRADUATED PATTERN, GRADUATED PATTERN DRAWING METHOD, AND GRADUATED PATTERN DRAWING DEVICE

DRAWING SHIFT MEASURING METHOD, EXPOSURE METHOD, GRADUATED PATTERN, GRADUATED PATTERN DRAWING METHOD, AND GRADUATED PATTERN DRAWING DEVICE

机译:牵伸位移测量方法,曝光方法,渐变图案,渐变图案绘制方法和渐变图案绘制设备

摘要

PROBLEM TO BE SOLVED: To measure an amount of drawing shift of an image to be drawn by a drawing head in a drawing slippage measuring method with higher accuracy.;SOLUTION: In the drawing shift measuring method, each of different graduated patterns U1, U2 is drawn on a recording medium 1 by each of the drawing heads 10a-10d so that each of the graduated patterns U1, U2 having predetermined different pitches is drawn on one recording medium 1 in parallel by the different exposure heads 10a-10d and the amount of drawing shift is measured by comparing the graduated patterns U1, U2 drawn on the recording medium 1 with each other.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:以较高的精度在绘图滑动测量方法中测量由绘图头绘制的图像的绘图偏移量;解决方案:在绘图偏移量测量方法中,每个不同的渐变图案U1,U2通过每个绘制头10a-10d在记录介质1上绘制图样,以使得具有预定不同间距​​的每个分度图案U1,U2通过不同的曝光头10a-10d和一个或多个平行地绘制在一个记录介质1上。通过比较记录在记录介质1上的刻度图案U1,U2来测量绘图偏移量。版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006276696A

    专利类型

  • 公开/公告日2006-10-12

    原文格式PDF

  • 申请/专利权人 FUJI PHOTO FILM CO LTD;

    申请/专利号JP20050098504

  • 申请日2005-03-30

  • 分类号G03F7/20;G01B11/00;G03F9/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:57:20

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