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首页> 外文期刊>Journal of Semiconductors >Back-illuminated Al_xGa_(1-x)N-based dual-band solar-blind ultraviolet photodetectors
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Back-illuminated Al_xGa_(1-x)N-based dual-band solar-blind ultraviolet photodetectors

机译:背照式基于Al_xGa_(1-x)N的双波段太阳盲紫外光电探测器

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摘要

Back-illuminated Al_xGa_(1-x)N-based dual-band solar-blind ultraviolet (UV) photodetectors (PDs) are realized by a three-terminal n–i–p–i–n heterojunction structure which is grown on sapphire substrate by metal organic chemical vapor deposition (MOCVD). The two p–i–n junctions contained in the heterojunction structure can work separately and independently. Working in the photovoltaic mode, the PDs display peak responsivity of ~10.8 mA/W at 242 nm and ~5.0 mA/W at 257 nm, respectively. The two junctions with different size, whose diameters are 500 μm and 800 μm, exhibit almost the same leakage current of ~1.3 × 10~(-9) A at a reverse bias of 10 V. Therefore, dark current densities of the two junctions are close to 6.6 × 10~(-7) A/cm~2 and 2.6 × 10~(-7) A/cm~2 at -10 V respectively.
机译:背照式基于Al_xGa_(1-x)N的双波段太阳盲紫外(UV)光电探测器(PD)是通过在蓝宝石衬底上生长的三端n–i–p–i–n异质结结构实现的通过金属有机化学气相沉积(MOCVD)。异质结结构中包含的两个p–i–n结可以分别独立工作。在光伏模式下,PD在242 nm和257 nm分别显示约10.8 mA / W和约5.0 mA / W的峰值响应度。直径分别为500μm和800μm的两个不同尺寸的结在反向偏置电压为10 V时表现出几乎相同的〜1.3×10〜(-9)A泄漏电流。因此,两个结的暗电流密度在-10 V时分别接近6.6×10〜(-7)A / cm〜2和2.6×10〜(-7)A / cm〜2。

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