Electron Backscatter Diffraction (EBSD) as a Predictive Tool for Amount of Cold Work in Ni-Based Welds and Base Materials

机译：电子背散射衍射（EBSD）作为预测镍基焊缝和母材冷加工量的工具

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来源
《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|1768-1769|共2页
会议地点 Phoenix, AZ(US)
作者
M.A. Othon; M.M. Morra; E. Willis;
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GE Global Research Niskayuna NY 12309;

Electric Power Research Institute (EPRI) Palo Alto California 94304;

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Electron Backscatter Diffraction (EBSD) as a Predictive Tool for Amount of Cold Work in Ni-Based Welds and Base Materials

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