首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Carbon doping of cubic GaN under gallium-rich growth conditions
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Carbon doping of cubic GaN under gallium-rich growth conditions

机译:富镓生长条件下立方氮化镓的碳掺杂

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Successful p-type doping of cubic GaN by carbon grown under Ga-rich conditions is reported with maximum hole concentration of 6 x 10~(18) cm~(-3) and hole mobility of 19 cm~2/Vs at room temperature, respectively. Cubic GaN:C was grown by rf-plasma assisted molecular beam epitaxy (MBE) on a semiinsu-lating GaAs (001) substrate (3 inches wafer). C-doping of the c-GaN was achieved by e-beam evaporation of a graphite rode with an C-flux of 1 x 10~(12) cm~(-2) s~(-1). Optical microscopy, Hall-effect measurements and room temperature photoluminescence were used for the investigation of the morphological, electrical and optical properties of cubic GaN: C. Under Ga-rich growth conditions most part of the carbon atoms were incorporated substitutially on N-site giving p-type conductivity. Our results verify that effective p-type doping of c-GaN can be achieved under Ga-rich growth conditions.
机译:据报道,在富Ga条件下生长的碳成功地对立方氮化镓进行了p型掺杂,室温下最大空穴浓度为6 x 10〜(18)cm〜(-3),空穴迁移率为19 cm〜2 / Vs,分别。通过射频等离子体辅助分子束外延(MBE)在半绝缘GaAs(001)衬底(3英寸晶圆)上生长立方氮化镓:C。 c-GaN的C掺杂是通过电子束蒸发具有1 x 10〜(12)cm〜(-2)s〜(-1)的C-通量的石墨棒实现的。光学显微镜,霍尔效应测量和室温光致发光用于研究立方氮化镓(C)的形态,电学和光学性质。在富Ga的生长条件下,大部分碳原子被取代地掺入N位置,得到p型电导率。我们的结果证明,在富Ga的生长条件下可以实现有效的p型GaN掺杂。

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