首页> 外国专利> ONIUM SALT COMPOUND CAPABLE OF PREPARING A POLYMER COMPOUND USEFUL FOR A CHEMICALLY AMPLIFIED RESIST COMPOUND SENSITIVE TO FAR ULTRAVIOLET RAYS, A POLYMER INCLUDING THE SAME, A CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND A PATTERNING METHOD USING THE CHEMICALLY AMPLIFIED RESIST COMPOSITION

ONIUM SALT COMPOUND CAPABLE OF PREPARING A POLYMER COMPOUND USEFUL FOR A CHEMICALLY AMPLIFIED RESIST COMPOUND SENSITIVE TO FAR ULTRAVIOLET RAYS, A POLYMER INCLUDING THE SAME, A CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND A PATTERNING METHOD USING THE CHEMICALLY AMPLIFIED RESIST COMPOSITION

机译:能够制备对远紫外光敏感的化学放大的抗蚀剂化合物有用的聚合物化合物的盐,包括该聚合物的聚合物,化学放大的抗蚀剂组合物以及采用化学方法配制的配制方法

摘要

PURPOSE: A chemically amplified resist composition is provided to ensure little dependability for a substrate, excellent adhesive property, good dry etching resistance, and excellent sensitivity, resolution, and development property.;CONSTITUTION: A compound has a structure represented by chemical formula 1. In chemical formula 1, R1 is hydrogen, trifluoromethyl, and C1-5 alkyl or C1-5 alkoxy; and A is represented by chemical formula 2 or 3. In chemical formula 2 or 3, R2, R3, R4, R5 and R6 are independently C1-20 substituted or unsubstituted alkyl group, C 3-10 substituted or unsubstituted aryl group, C1-10 substituted or unsubstituted perfluoroalkyl group, substituted or unsubstituted benzyl group, or C6-30 substituted or unsubstituted aryl group.;COPYRIGHT KIPO 2010
机译:用途:提供一种化学放大的抗蚀剂组合物,以确保对基板的依赖性小,优异的粘合性能,良好的耐干蚀刻性以及出色的灵敏度,分辨率和显影性能。;组成:一种化合物具有化学式1表示的结构。在化学式1中,R 1是氢,三氟甲基和C 1-5烷基或C 1-5烷氧基;并且A由化学式2或3表示。在化学式2或3中,R 2,R 3,R 4,R 5和R 6独立地为C 1-20取代或未取代的烷基,C 3-10取代或未取代的芳基,C 1-。 10个取代或未取代的全氟烷基,取代或未取代的苄基或C6-30取代或未取代的芳基。; COPYRIGHT KIPO 2010

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