- METHOD OF REDUCING THE OCCURRENCE OF BURN-IN DUE TO NEGATIVE BIAS TEMPERATURE INSTABILITY

摘要

CLAIMS What is claimed is: 1. A method for enabling a start-up process on a device containing a plurality of conductive memory elements and for mitigating a burn-in effect, Wherein the response patterns of useful start-up values for identification are dependent on physical characteristics, and the method further comprises, after initiation of the memory elements, for a response pattern previously read from the same memory elements And recording the inverse data pattern to the memory elements. Therefore, deterioration of PMOS transistors due to NBTI can be mitigated.;