首页> 外国专利> InGaAs - InGaAs Quantum dot-ring structure grown using droplet epitaxy and method of manufacturing the same

InGaAs - InGaAs Quantum dot-ring structure grown using droplet epitaxy and method of manufacturing the same

机译:InGaAs-利用液滴外延生长的InGaAs量子点环结构及其制造方法

摘要

According to an embodiment of the present invention, provided is an InGaAs quantum dot-ring structure manufacturing method which includes: a step of forming indium droplets on the surface of a GaAs substrate at an indium flux of 0.1 (±5%) ML/s; a step of generating InGaAs nanocrystals by supplying As to the surface of the GaAs substrate with an As valve which is 5% opened while maintaining 350 °C for 120 seconds; and a step of growing the InGaAs nanocrystals into an InGaAs quantum dot-ring structure by supplying the As with the As valve which is fully opened while maintaining 350 °C for 120 seconds. The InGaAs quantum dot-ring structure is formed with a first valley which is narrower than a second valley formed in the front and rear sides, and the structure is grown to have an oval ring formed in the center and a ring edge including a ridge comprising a second InGaAs quantum dot formed in the left side and a first InGaAs quantum dot formed in the right side at a lower height than the second InGaAs quantum dot.
机译:根据本发明的实施例,提供了一种InGaAs量子点环结构的制造方法,该方法包括:以0.1(±5%)ML / s的铟通量在GaAs衬底的表面上形成铟液滴的步骤。 ;在350℃下保持120秒的同时,通过向GaAs基板的表面供给5%的As阀向As供给As来生成InGaAs纳米晶体的工序。通过向As提供完全打开的As阀同时在350℃下保持120秒来将InGaAs纳米晶体生长为InGaAs量子点环结构的步骤。 InGaAs量子点环结构形成有第一凹部,该第一凹部比在前后侧形成的第二凹部窄,并且该结构被生长为具有形成在中心的椭圆形环和包括具有脊的脊的环边缘。在左侧形成的第二InGaAs量子点和在右侧形成的第一InGaAs量子点的高度低于第二InGaAs量子点的高度。

著录项

  • 公开/公告号KR101832340B1

    专利类型

  • 公开/公告日2018-02-26

    原文格式PDF

  • 申请/专利号KR20160149691

  • 发明设计人 LEE JI HOON;

    申请日2016-11-10

  • 分类号H01L29/12;C09K11/62;H01L21/02;H01L29/06;H01L29/15;B82Y20;

  • 国家 KR

  • 入库时间 2022-08-21 12:38:18

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