首页> 外国专利> Photomask manufacturing method, drawing device, display device manufacturing method, photomask substrate inspection method, and photomask substrate inspection device

Photomask manufacturing method, drawing device, display device manufacturing method, photomask substrate inspection method, and photomask substrate inspection device

机译:光掩模的制造方法,绘图装置,显示装置的制造方法,光掩模的基板检查方法及光掩模的基板检查装置

摘要

PROBLEM TO BE SOLVED: To efficiently improve accuracy of coordinates in manufacturing a photomask.SOLUTION: A method for manufacturing a photomask is provided, where the photomask has a transfer pattern based on designed drawing data W1 on a first major surface of a transparent substrate, and the method includes: a step of mounting a photomask substrate having a thin film and a resist film deposited on the first major surface thereof, on a stage of a drawing apparatus; a drawing step of drawing a pattern on the photomask substrate; and a step of patterning the thin film by using the resist pattern formed by developing the resist film. In the drawing step, drawing apparatus-specific data M1 representing a deformation amount imparted by the drawing apparatus to the shape of the photomask substrate, and back face data S2 representing a second major surface shape of the photomask substrate are prepared; and the transfer pattern is drawn on the photomask substrate by reflecting a coordinate misalignment synthesized amount D1 caused by the drawing apparatus-specific data M1 and the back face data S2 on the designed drawing data W1.SELECTED DRAWING: Figure 3
机译:解决的问题:为了有效地提高制造光掩模的坐标的精度。解决方案:提供了一种制造光掩模的方法,其中该光掩模具有基于透明基板的第一主表面上的设计图数据W1的转印图案,所述方法包括以下步骤:将具有薄膜和在其第一主表面上沉积的抗蚀剂膜的光掩模基板安装在绘制设备的平台上;在光掩模基板上绘制图案的绘制步骤;通过使用使抗蚀剂膜显影而形成的抗蚀剂图案对薄膜进行图案化的步骤。在描绘工序中,准备代表描绘装置赋予光掩模基板的形状的变形量的描绘装置固有数据M1和代表光掩模基板的第二主面形状的背面数据S2。然后通过在设计图数据W1上反映由绘制装置专用数据M1和背面数据S2引起的坐标未对准合成量D1,在光掩模基板上绘制转印图案。

著录项

  • 公开/公告号JP6556673B2

    专利类型

  • 公开/公告日2019-08-07

    原文格式PDF

  • 申请/专利权人 HOYA株式会社;

    申请/专利号JP20160146741

  • 发明设计人 寺田 寿美;

    申请日2016-07-26

  • 分类号G03F1/20;G03F7/20;G03F1/76;G03F1/80;G03F1/84;

  • 国家 JP

  • 入库时间 2022-08-21 12:18:54

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号