首页> 外国专利> Transistors having on-chip integrated photon source or photonic-ohmic drain to facilitate de-trapping electrons trapped in deep traps of transistors

Transistors having on-chip integrated photon source or photonic-ohmic drain to facilitate de-trapping electrons trapped in deep traps of transistors

机译:具有片上集成光子源或光子欧姆漏极的晶体管,以促进将陷于晶体管深阱中的电子去陷获

摘要

Techniques are provided that pumping of deep traps in GaN electronic devices using photons from an on-chip photon source. In various embodiments, a method for optical pumping of deep traps in GaN HEMTs is provided using an on-chip integrated photon source that is configured to generate photons during operation of the HEMT. In an aspect, the on-chip photon source is a SoH-LED. In various additional embodiments, an integration scheme is provided that integrates the photon source into the drain electrode of a HEMT, thereby converting the conventional HEMT with an ohmic drain to a transistor with hybrid photonic-ohmic drain (POD), a POD transistor or PODFET for short.
机译:提供了使用来自片上光子源的光子泵浦GaN电子器件中的深陷阱的技术。在各种实施例中,提供了一种使用片上集成光子源来对GaN HEMT中的深陷阱进行光泵浦的方法,该芯片上集成的光子源被配置为在HEMT的操作期间产生光子。在一方面,片上光子源是SoH-LED。在各种其他实施例中,提供了一种集成方案,该方案将光子源集成到HEMT的漏极中,从而将具有欧姆漏极的常规HEMT转换为具有混合光子欧姆漏极(POD)的晶体管,POD晶体管或PODFET简而言之。

著录项

  • 公开/公告号US10270436B2

    专利类型

  • 公开/公告日2019-04-23

    原文格式PDF

  • 申请/专利号US201515526744

  • 发明设计人 XI TANG;JING CHEN;BAIKUI LI;

    申请日2015-11-13

  • 分类号H01L27/15;H01L29/06;H01L29/10;H01L29/20;H01L33/00;H01L33/32;H01L33/36;H03K17/06;H01L29/205;H01L29/207;H01L29/417;H01L29/778;

  • 国家 US

  • 入库时间 2022-08-21 12:14:07

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号