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首页> 外文期刊>Electron Devices, IEEE Transactions on >InAlAs Avalanche Photodiode With Type-II Superlattice Absorber for Detection Beyond 2 $muhbox{m}$
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InAlAs Avalanche Photodiode With Type-II Superlattice Absorber for Detection Beyond 2 $muhbox{m}$

机译:带有II型超晶格吸收体的InAlAs雪崩光电二极管,可检测2个以上的像素$ muhbox {m} $

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摘要

An avalanche photodiode (APD) using a InAlAs multiplication region and a type-II InGaAs/GaAsSb superlattice as the absorber (both lattice matched to InP) is reported. An optical and electrical characterization of the photodiode is performed. The APD exhibited an absorption cutoff wavelength of 2.5 $mu hbox{m}$, which is expected from the InGaAs/GaAsSb superlattice. A responsivity of 0.47 A/W (without gain) for the APD at a 2004-nm wavelength was demonstrated. The APD breakdown voltage showed a weak temperature dependence of $sim$40 mV/K, as a result of the excellent temperature stability in InAlAs.
机译:据报道,雪崩光电二极管(APD)使用InAlAs倍增区和II型InGaAs / GaAsSb超晶格作为吸收体(晶格均与InP匹配)。进行光电二极管的光学和电学表征。 APD的吸收截止波长为2.5μhhbox {m} $,这是InGaAs / GaAsSb超晶格所期望的。在2004纳米波长处,APD的响应度为0.47 A / W(无增益)。由于InAlAs中出色的温度稳定性,APD击穿电压显示出较弱的温度依赖性,即$ sim $ 40 mV / K。

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