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Epitaxial growth and optical properties of semipolar (1122) GaN and InGaN/GaN quantum wells on GaN bulk substrates

机译:GaN块状衬底上的半极性(1122)GaN和InGaN / GaN量子阱的外延生长和光学性质

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摘要

GaN and InGaN/GaN multiple quantum well (MQW) were grown on semipolar (1122) GaN bulk substrates by metal organic vapor phase epitaxy. The GaN homoepitaxial layer has an atomically flat surface. Optical reflection measurements reveal polarization anisotropy for the A, B, and C excitons. Free A excitons dominate the photoluminescence (PL) spectrum at 10 K and are accompanied by a weaker, sharp doublet emission due to neutral donor-bound excitons. The InGaN/GaN MQW grown on a GaN homoepitaxial layer involves fast radiative recombination processes. The PL decay monitored at 428 nm can be fitted with a double exponential curve, which has lifetimes of 46 and 142 ps at 10 K. These values are two orders of magnitude shorter than those in conventional c-oriented QWs and are attributed to the weakened internal electric field. The emissions from GaN and MQW polarize along the [1100] direction with polarization degrees of 0.46 and 0.69, respectively, due to the low crystal symmetry.
机译:通过金属有机气相外延在半极性(1122)GaN块状衬底上生长GaN和InGaN / GaN多量子阱(MQW)。 GaN同质外延层具有原子平坦的表面。光学反射测量揭示了A,B和C激子的偏振各向异性。游离A激子在10 K时占据了光致发光(PL)光谱的主导地位,并且由于中性的供体结合激子而伴随着较弱的尖峰发射。在GaN同质外延层上生长的InGaN / GaN MQW涉及快速辐射复合过程。在428 nm处监控的PL衰减可以拟合双指数曲线,在10 K时的寿命分别为46和142 ps。这些值比传统的c定向QW短两个数量级,并且归因于减弱内部电场。由于较低的晶体对称性,GaN和MQW的发射沿[1100]方向极化,极化度分别为0.46和0.69。

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