首页> 外文会议>Symposium on III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics >QUANTITATIVE EXPERIMENTAL DETERMINATION OF THE EFFECT OF DISLOCATION - DISLOCATION INTERACTIONS ON STRAIN RELAXATION IN LATTICE MISMATCHED HETEROSTRUCTURES
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QUANTITATIVE EXPERIMENTAL DETERMINATION OF THE EFFECT OF DISLOCATION - DISLOCATION INTERACTIONS ON STRAIN RELAXATION IN LATTICE MISMATCHED HETEROSTRUCTURES

机译:定量实验测定脱位脱位相互作用对晶格错配异质结构中应变松弛的影响

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We present real time observations of the interaction of dislocations in heteroepitaxial strained layers using a specially modified ultrahigh vacuum transmission electron microscope equipped with in-situ deposition capabilities. These observations have led to delineation of the regime of epilayer thickness and composition where dislocation interactions result in blocking of the propagating threading segment. It is found that both the blocking probability as well as the magnitude of the dislocation interaction force are strongly dependent on the Burgers vectors of the dislocations involved, with the greatest effects observed when the Burgers vectors of the two dislocations are parallel with respect to each other. Frame-by-frame analysis of the motion of the dislocation threading segment during interaction is used to extract the magnitude of the interaction stresses as a function of both the level of heteroepitaxial strain and the dislocation geometry. Finally, by continuing growth following observations of blocking during annealing, we find that blocked dislocations are likely to remain in that configuration until substantial additional heteroepitaxial stresses are incorporated into the layer. These results have direct relevance to the successful integration of strained layer heterostructures into electronic device applications. This is because blocked threading segments result in the introduction of undesired band gap states, enhance impurity diffusion, modify surface morphology and act to limit the dislocation density reductions achievable in graded buffer structures.
机译:我们在使用装备有在原位沉积能力的特殊改性的超高真空传输电子显微镜异质外延应变层的位错的相互作用的本实时观测。这些观察导致了外延层厚度和组合物的方案,其中位错相互作用导致传播螺纹段的阻断的描绘。据发现,无论是阻塞概率以及位错的相互作用力的大小在很大程度上取决于所涉及的位错的伯格斯矢量,以最大的效应观察到当两个位错的伯格斯矢量平行相对于彼此。帧接一帧的交互期间的位错螺纹段的运动的分析来提取相互作用应力的大小作为异质外延应变的两个水平和错位几何形状的函数。最后,通过继续生长以下退火期间阻断的观察,我们发现,阻止位错有可能保持在该构型,直到大量的额外的异质外延应力被掺入层。这些结果直接关系到成功整合应变层异质到电子设备的应用程序。这是因为阻止螺纹段导致引入不期望的带隙状态,提高杂质扩散,修改表面形态,其作用是限制位错密度的减少在渐变缓冲结构实现的。

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