首页> 外文会议>Automation and Test in Europe Conference and Exhibition >The design and test of a smartcard chip using a CHAIN self-timed network-on-chip
【24h】

The design and test of a smartcard chip using a CHAIN self-timed network-on-chip

机译:智能卡芯片使用链式芯片芯片的设计和测试

获取原文

摘要

The CHAIN self-timed network-on-chip (NoC) architecture provides a flexible, clock-independent solution to the problems of system-on-chip (SoC) interconnect. In this paper we look at the use of CHAIN in a low-performance, smartcard chip to connect two self-timed processors and a range of memories and peripherals. Key design-time advantages provided by the use of CHAIN in this design included the ability to operate a very-narrow, high-frequency network fabric using serial communication without the need for high frequency clocking, rapid assembly in the final stages of the design and the avoidance of the need to perform timing analysis or validation on the SoC interconnect. Additionally we describe a bare port that provided direct access to the CHAIN fabric which was instrumental in testing and debugging the smartcard chip.
机译:链条自定时网络(NOC)架构为片上系统(SOC)互连的问题提供了灵活的时钟无关的解决方案。在本文中,我们可以在低性能,智能卡芯片中使用链条,以连接两个自定时处理器和一系列存储器和外围设备。在这种设计中使用链条提供的关键设计优势包括使用串行通信操作非常窄的高频网络结构,而无需高频时钟,在设计的最终阶段的快速组装中避免需要在SOC互连上执行时序分析或验证。此外,我们还描述了一种裸端口,提供了直接访问的链面料,这是在测试和调试智能卡芯片的工具中的乐器。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号