Displacement Current Measurement of MIS Devices with Ionic Liquids to Explore Carrier Behaviors in Model Interfaces of Organic Devices

摘要

Charge injection property of organic thin film devices is a key issue to understand the device operation. Displacement current measurement (DCM) is a powerful technique to probe the charge injection behaviors in terms of a change in the apparent capacitance of test devices. However, it requires to suppress actual current flowing through the device for investigating the details of interface phenomena. We propose here the use of ionic liquids (ILs) as a top contact insulator in organic metal-insulator-semiconductor (MIS) structures. Because of the high stability and dielectric constant of the ILs, the external applied voltage was applied mainly to the organic layer with suppressing the actual current. The DCM curves of Pt wire/IL/a-NPD/ITO structure were measured, and they actually show the signals due to the hole injection from the ITO to α-NPD layer and accumulation at the IL/a-NPD.