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Advancement of microelectronics-grade carbon nanotube materials for NRAM#x00AE; device manufacture

机译:用于NRAM ®装置制造的微电子级碳纳米管材料的推进

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This work focuses on the development of electronics-grade carbon nanotube (CNT) formulations for commercialization of CNT-based memory devices. Preparing and providing these critical materials is key to empowering innovation and tapping the potential promised for CNT memory device technologies. This paper will review the quality improvements made by Brewer Science in the development of its third-generation CNT materials, which demonstrate a 10X increase in CNT concentration with a 5X reduction in metal ion content in non-surfactant, aqueous, room-temperature-stable formulations. To provide an integrated solution for CNT memory, these improvements are needed to reduce material consumption and overall processing time and cost. However, increased CNT concentration leads to loss of shelf life stability of the formulations and increases the concentrations of metal ions that must be removed. Both the development and characterization of analytical tests with wafer validation testing will be reviewed. Critical parameters, device architecture, and array performance results for CNT memory device in a 130-nm, 4-MB memory device is also reviewed.
机译:这项工作侧重于开发电子级碳纳米管(CNT)配方,用于商业化基于CNT的存储器件。准备和提供这些关键材料是赋予创新的关键,并挖掘CNT记忆设备技术所承诺的潜力。本文将审查啤酒科学在发展第三代CNT材料的发展中提出的质量改进,其在非表面活性剂,水性,室温稳定的金属离子含量下的5倍降低了10倍的CNT浓度增加配方。为了提供CNT存储器的集成解决方案,需要这些改进来降低材料消耗和整体处理时间和成本。然而,增加的CNT浓度导致制剂的保质期稳定性的损失,并增加必须除去的金属离子的浓度。将审查使用晶圆验证测试的分析测试的开发和表征。还查看了CNT存储器设备中的关键参数,设备架构和阵列性能结果,在130nm中,4 MB内存设备的CNT存储器设备。

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