首页> 外文会议>International Conference on Silicon Carbide and Related Materials 2001 Pt.2 Oct 28-Nov 2, 2001 Tsukuba, Japan >Photoluminescence and Electroluminescence Characterization of In_xGa_(1-x)N/lnyGa_(1-y)N Multiple Quantum Well Light Emitting Diodes
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Photoluminescence and Electroluminescence Characterization of In_xGa_(1-x)N/lnyGa_(1-y)N Multiple Quantum Well Light Emitting Diodes

机译:In_xGa_(1-x)N / lnyGa_(1-y)N多量子阱发光二极管的光致发光和电致发光特性

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We report on a study of radiative recombination in In_(0.11)Ga_(0.89)N/In_(0.01)Ga_(0.99)N multiple quantum wells (MQWs). The QWs were nominally undoped, while the InGaN barriers were Si doped. The MQW part is situated in the depletion field of a pn-junction structure with electrical contacts, so that both photoluminescence (PL) and electroluminescence (EL) can be studied as a function of bias. The PL and EL spectra are distinctly different, in particular at low temperatures. The spectral properties and related differences in PL decay times reflect different recombination conditions in the MQW region for the individual QWs.
机译:我们报告了对In_(0.11)Ga_(0.89)N / In_(0.01)Ga_(0.99)N多量子阱(MQWs)中的辐射复合的研究。 QW名义上是未掺杂的,而InGaN势垒是Si掺杂的。 MQW部件位于具有电接触的pn结结构的耗尽区中,因此可以将光致发光(PL)和电致发光(EL)都作为偏置的函数进行研究。 PL和EL光谱有明显不同,特别是在低温下。 PL衰减时间的光谱特性和相关差异反映了各个QW在MQW区域中的不同重组条件。

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