【24h】

Luminescence from defects in GaN

机译:GaN中的缺陷发光

获取原文
获取原文并翻译 | 示例

摘要

We briefly review the luminescence properties of defects in GaN and focus on the most interesting defects. In particular, the blue luminescence band peaking at about 3 eV is assigned to different defects and even different types of transitions in undoped, Zn-, C-, and Mg-doped GaN. Another omnipresent luminescence band, the yellow luminescence band may have different origin in nearly dislocation-free freestanding GaN templates, undoped thin layers, and carbon-doped GaN. The Y_4 and Y_7 lines are caused by recombination at unidentified point defects captured by threading edge dislocations.
机译:我们简要回顾了GaN中缺陷的发光特性,并重点介绍了最有趣的缺陷。特别地,在约3 eV处达到峰值的蓝色发光带被分配给未掺杂,Zn,C和Mg掺杂的GaN中的不同缺陷,甚至不同类型的跃迁。另一个无处不在的发光带,黄色发光带可能来自几乎无位错的独立式GaN模板,未掺杂的薄层和碳掺杂的GaN。 Y_4和Y_7线是由于螺纹边缘位错捕获的未识别点缺陷处的重组而引起的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号