Integrated Service Technology Inc., 1F, NO.19, Puding Rd., East District, Hsinchu 30072, Taiwan, 30010, ROC;
Integrated Service Technology Inc., 1F, NO.19, Puding Rd., East District, Hsinchu 30072, Taiwan, 30010, ROC;
Integrated Service Technology Inc., 1F, NO.19, Puding Rd., East District, Hsinchu 30072, Taiwan, 30010, ROC;
Peking University Software and Microelectronic, Haidian District, Beijing, 100871, China;
Inspection; Failure analysis; Metals; Milling; Tools; Surface treatment; Semiconductor device measurement;
机译:平面TEM的二合一样品制备
机译:从SEM截面到TEM样品-通过“补充”技术制备FIB样品的新功能
机译:用于结构材料各种TEM分析的TEM样品改良制备技术
机译:具有高级样品制备方案的新型效率的效率效率的解决方案和平面图分析
机译:用于TEM分析的碳纳米管复合样品制备的切片机切割工艺的改进。
机译:一种快速和植入的样品生产方法用于大型电子透明金属样品用于基于MEMS的原位S / TEM实验
机译:原位TEM拉伸变形研究横截面中多层材料的制备
机译:用于原位TEm拉伸变形研究的横截面多层材料的制备。