首页> 外国专利> AlxGa1-xN 0.5x1 Method of manufacturing AlxGa1-xN 0.5x1 piezoelectric thin films with high crystallinity and their apparatus using the thin film

AlxGa1-xN 0.5x1 Method of manufacturing AlxGa1-xN 0.5x1 piezoelectric thin films with high crystallinity and their apparatus using the thin film

机译:Alxga1-Xn 0.5x1制造具有高结晶度的Alxga1-xn 0.5x1压电薄膜的方法及其使用薄膜的装置

摘要

The present disclosure provides a method for manufacturing an Al x Ga 1-x N (0.5≤x≤1) piezoelectric thin film, the method comprising: forming a sacrificial layer on a sapphire film-forming substrate; and, growing an Al x Ga 1-x N (0.5≤x≤1) piezoelectric thin film on the sacrificial layer; including, growing an Al x Ga 1-x N (0.5≤x≤1) piezoelectric thin film Al x Ga 1-x N (0.5≤x≤1) piezoelectric, characterized in that it further comprises; prior to forming a first semiconductor layer of Al y Ga 1-y N (0.5≤y≤1) A method for manufacturing a thin film and a structure including the Al x Ga 1-x N (0.5≤x≤1) piezoelectric thin film.
机译:本公开提供了一种制造Al X Ga 1-x N(0.5≤x≤1)压电薄膜的方法,该方法包括:在蓝宝石成膜基材上形成牺牲层; 并且,在牺牲层上生长Al X Ga 1-x N(0.5≤x≤1)压电薄膜; 包括,生长Al X Ga 1-x N(0.5≤x≤1)压电薄膜Al X Ga 1-x N(0.5≤x≤1)压电,其特征在于它还包括; 在形成Al Y Ga 1-Y N(0.5≤y≤1)的第一半导体层之前,用于制造薄膜的方法和包括Al X Ga 1-x N(0.5≤x≤1)压电薄的结构 电影。

著录项

  • 公开/公告号KR102301861B1

    专利类型

  • 公开/公告日2021-09-14

    原文格式PDF

  • 申请/专利权人 안상정;

    申请/专利号KR20190023998

  • 发明设计人 안상정;

    申请日2019-02-28

  • 分类号H01L41/316;H01L41/047;H01L41/08;H01L41/187;

  • 国家 KR

  • 入库时间 2022-08-24 21:02:17

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