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ANALYSIS METHOD OF A DEVICE, PERFORMED THROUGH A MEMS SENSOR, AND SYSTEM THEREOF INCLUDING THE DEVICE AND THE MEMS SENSOR
ANALYSIS METHOD OF A DEVICE, PERFORMED THROUGH A MEMS SENSOR, AND SYSTEM THEREOF INCLUDING THE DEVICE AND THE MEMS SENSOR
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机译:通过MEMS传感器执行的设备的分析方法,以及包括设备和MEMS传感器的系统
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摘要
An analysis method of a device through a MEMS sensor is provided in which the MEMS sensor includes a control unit and a sensing assembly coupled to the device. The analysis method includes acquiring, through the sensing assembly, first data indicative of an operative state of the device. Testing is performed for the presence of a first abnormal operating condition of the device. If the first abnormal operating condition of the device is confirmed, a self-test of the sensing assembly is performed to generate a quantity indicative of an operative state of the sensing assembly. The self-test includes acquiring, through the sensing assembly, second data indicative of the operative state of the sensing assembly, generating a signature according to the second data, and processing the signature through deep learning techniques to generate said quantity.
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