SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS, TESTING BOARD, AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To test a semiconductor device speedily. ;SOLUTION: The semiconductor integrated circuit testing apparatus for testing the operation of a plurality of semiconductor devices X in parallel by supplying a testing signal to the plurality of semiconductor devices X simultaneously packages a plurality of IC sockets 4 for fitting the semiconductor devices X, and comprises a testing board 1 where an opening/closing switch 6 is provided in the middle of a signal line L for transmitting the testing signal to the IC socket 4, and a line selection control section 3d for controlling the opening/closing switch 6.;COPYRIGHT: (C)2003,JPO