Testing methods for current-mode integrated circuits under the very low cost tester (VLCT) and LabViewRTM test platform.

摘要

The purpose of this project is to generate algorithms and methods using the Very Low Cost Tester (VLCT) donated by Texas Instruments (TI) and LabView RTM in order to perform electrical testing of Current-Mode Circuits.; The most useful formula to solve complex problems is by applying the proverb: "divide and conquer". Following this philosophy, a basic and small circuit that holds all the principles of current-mode circuits is the best option to develop algorithms and programs. In consequence, the current project framework comprises only the basic current-mirrors, because with short algorithms and programs is possible to create larger programs for complex circuits. Only DC stimuli will be used. The AC stimuli are out of the scope of this project; it should be proposed for future research.; The contributions of this project are: (1) Procedures and algorithms for testing basic current-mirrors using VLCT. (2) Integration between VLCT and LabView using a virtual instrument. (3) Test programs in Pascal programming language for VLCT that can be used to create more complex programs. (4) Example of Pascal programming language for DOS that can be used to compile and create an application or executable file and that can be exported to VLCT Pascal programming platform with minor changes. (Abstract shortened by UMI.)