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Methods of extracting SPICE parameters, performing a spice calculation, and performing device simulation for a partially-depleted SOI MOSFET

机译:提取SPICE参数,进行香料计算以及对部分耗尽的SOI MOSFET进行器件仿真的方法

摘要

Procedures for SPICE parameter extraction, SPICE calculation, and device simulation for a partially depleted SOI MOSFET are provided. First, SPICE calculation parameters are set. At this time, parameters that describe the body current characteristics are not extracted but rather the body current is estimated to be zero. Then, in place of parameters that describe the body current characteristics, information regarding the steady state during circuit operation that is normally found from the body current characteristics, which is to say, the body charge and oscillation in the body potential, is treated as macro parameters that encompass information regarding the body current characteristics. After setting the parameters that include such macro parameters, a SPICE calculation for transient analysis is performed.
机译:提供了用于部分耗尽的SOI MOSFET的SPICE参数提取,SPICE计算和器件仿真的过程。首先,设置SPICE计算参数。此时,不提取描述体电流特性的参数,而是将体电流估计为零。然后,代替描述体电流特性的参数,将通常从体电流特性中找到的关于电路操作期间的稳态的信息(即体电荷和体电位的振荡)视为宏。包含有关人体电流特征信息的参数。设置包含此类宏参数的参数后,将执行用于瞬态分析的SPICE计算。

著录项

  • 公开/公告号US2005055191A1

    专利类型

  • 公开/公告日2005-03-10

    原文格式PDF

  • 申请/专利权人 MICHIRU HOGYOKU;

    申请/专利号US20030720740

  • 发明设计人 MICHIRU HOGYOKU;

    申请日2003-11-24

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 22:20:48

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