Comparison method of X-ray diffraction patterns using the fundamental parameter method

摘要

A method for analyzing the pattern, the method receives a first diffraction pattern; said; determination of similarity of the second diffraction pattern between said first and; receiving the third diffraction pattern; receiving the second diffraction pattern The hierarchical cluster analysis on the second diffraction pattern and the first based on the resemblance is determined as well; determine the similarity of the third diffraction patterns between said second and; determine the similarity of the third diffraction patterns between the 1 I include the implementation of. A matching method of X-ray diffraction pattern using (FP) method fundamental parameter, these patterns, the intensity envelope of the pattern or that the matching pattern based on the peak was identified and that the identification of peaks in the pattern can be matched by matching the line. Similarity between the patterns is represented by a score by performing hierarchical cluster analysis and (HCA) for the pattern, it can be used to obtain the dendrogram.