METHOD OF COMPARING X-RAY DIFFRACTION PATTERNS USING THE FUNDAMENTAL PARAMETER METHOD

摘要

A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity. Method of matching X-ray diffraction patterns using the fundamental parameter (FP) method. Patterns may be matched by identifying peaks within the patterns and matching the patterns based on the identified peaks or by matching the intensity envelopes of the patterns. The similarities between the patterns are expressed by scores which may be used to perform hierarchical cluster analysis (HCA) on the patterns to yield a dendrogram.