TEST CIRCUIT FOR RANDOM NUMBER GENERATION CIRCUIT, AND TEST METHOD FOR RANDOM NUMBER GENERATION CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a test circuit and test method for a random number generation circuit, capable of easily setting an operation time for generating random numbers which never cause collision to the random number generation circuit.;SOLUTION: A random number generation circuit 2 which shows a transitional response up to generation of random numbers is activated from an initial state by applying a random number generation activation signal 10 just after a reset signal 9 thereto to start random number generating operation, and fetches output data to a buffer memory 6 at a time after an end signal 15 set by an operation time setting signal 13. Two pieces of output data 16 fetched for a predetermined frequency are compared by a comparison circuit 7, and when even one matching set is present, the same operation is repeated by extending the operation time, whereby an operation time capable of generating sufficiently random numbers without collision is calculated.;COPYRIGHT: (C)2009,JPO&INPIT