首页> 外国专利> Displacing edge segments on a fabrication layout based on proximity effects model amplitudes for correcting proximity effects

Displacing edge segments on a fabrication layout based on proximity effects model amplitudes for correcting proximity effects

机译:根据邻近效应模型幅度在制造布局上移动边缘片段,以校正邻近效应

摘要

Techniques for forming a mask fabrication layout for a physical integrated circuit design layout include correcting the fabrication layout for proximity effects using a proximity effects model. A proximity effects model is executed to produce an initial output. The initial output is based on a first position for a segment in a fabrication layout. The first position is displaced from a corresponding original edge in the original fabrication layout by a distance equal to an initial bias. The model is also executed to produce a second output based on a second position for the segment. The second position is displaced from the corresponding original edge by a distance equal to a second bias. An optimal bias for the segment is determined based on the initial output and the second output. The segment is displaced in the fabrication layout from the corresponding edge based on the optimal bias.
机译:用于形成用于物理集成电路设计布局的掩模制造布局的技术包括使用接近效应模型来针对接近效应校正制造布局。执行邻近效应模型以产生初始输出。初始输出基于制造布局中某个段的第一位置。第一位置从原始制造布局中的对应原始边缘偏移等于初始偏置的距离。还执行该模型以基于该段的第二位置产生第二输出。第二位置从相应的原始边缘移位等于第二偏置的距离。基于初始输出和第二输出来确定该段的最佳偏置。该段在制造布局中基于最佳偏置从相应的边缘移开。

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