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SYSTEMS AND METHODS FOR HANDLING NEGATIVE BIAS TEMPERATURE INSTABILITY STRESS IN MEMORY BITCELLS
SYSTEMS AND METHODS FOR HANDLING NEGATIVE BIAS TEMPERATURE INSTABILITY STRESS IN MEMORY BITCELLS
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机译:处理内存双电池负偏温度不稳定性应力的系统和方法
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摘要
A system and method reduce stress caused by NBTI effects by determining if a trigger event has occurred and if so inverting all input data values to the memory and all output data values from the memory during a period of time defined by the determined trigger event. In one embodiment, the trigger event is an alternate memory power-up.
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