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Method for reading images of complementary metal oxide semiconductor detector, involves forming corrected image by determining difference of image and corrected reset image based on difference of reset image and correction reset frame
Method for reading images of complementary metal oxide semiconductor detector, involves forming corrected image by determining difference of image and corrected reset image based on difference of reset image and correction reset frame
The method involves reading a reset image which is generated prior to the recording of image. A correction reset frame is obtained by the preceding image and specific pixel correction terms of complementary metal oxide semiconductor (CMOS) detector (3) which are predetermined in a calibration mode. A corrected reset image is formed by determining the difference of reset image and correction reset frame. The image is read out. A corrected image is formed by determining the difference of image and corrected reset image. An independent claim is included for device for reading images.
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