首页> 外国专利> Method for reading images of complementary metal oxide semiconductor detector, involves forming corrected image by determining difference of image and corrected reset image based on difference of reset image and correction reset frame

Method for reading images of complementary metal oxide semiconductor detector, involves forming corrected image by determining difference of image and corrected reset image based on difference of reset image and correction reset frame

机译:读取互补金属氧化物半导体检测器的图像的方法,涉及通过基于复位图像和校正复位帧的差异确定图像和校正后的复位图像的差异来形成校正后的图像。

摘要

The method involves reading a reset image which is generated prior to the recording of image. A correction reset frame is obtained by the preceding image and specific pixel correction terms of complementary metal oxide semiconductor (CMOS) detector (3) which are predetermined in a calibration mode. A corrected reset image is formed by determining the difference of reset image and correction reset frame. The image is read out. A corrected image is formed by determining the difference of image and corrected reset image. An independent claim is included for device for reading images.
机译:该方法包括读取在图像记录之前产生的复位图像。通过在校准模式下预定的互补金属氧化物半导体(CMOS)检测器(3)的先前图像和特定像素校正项来获得校正复位帧。通过确定复位图像与校正复位帧的差异来形成校正后的复位图像。图像被读出。通过确定图像与校正后的复位图像之差来形成校正后的图像。包含用于读取图像的设备的独立权利要求。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号