首页> 外国专利> Taking X-ray images with digital solid state detector involves taking new correction image depending on temperature difference at different times, and using to correct subsequent X-ray rough images depending on temperature difference

Taking X-ray images with digital solid state detector involves taking new correction image depending on temperature difference at different times, and using to correct subsequent X-ray rough images depending on temperature difference

机译:使用数字固态检测器拍摄X射线图像涉及根据不同时间的温度差拍摄新的校正图像,并根据温度差来校正后续的X射线粗糙图像

摘要

The method involves the detector (21) producing a rough image of an investigation object and electronically correcting the image in a correction unit, measuring a temperature at at least one point of the detector at defined time intervals, taking a new correction image depending on the difference in temperatures at different times and using it at least partly to correct subsequent X-ray rough images depending on the temperature difference. An independent claim is also included for a digital solid state detector.
机译:该方法包括检测器(21)产生检查对象的粗糙图像,并在校正单元中对图像进行电子校正,以限定的时间间隔在检测器的至少一个点上测量温度,并根据检测结果获取新的校正图像。在不同时间的温度差异,并至少部分地用于根据温度差异校正后续的X射线粗糙图像。数字固态检测器也包含独立权利要求。

著录项

  • 公开/公告号DE102005025429B3

    专利类型

  • 公开/公告日2006-11-23

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20051025429

  • 发明设计人 HOERNIG MATHIAS;

    申请日2005-06-02

  • 分类号G03B42/02;G01N23/04;G01T1/29;H04N5/325;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:58

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