INSPECTION TEST METHOD AND AN APPARATUS OF GAS INSULATED SWITCHGEAR USING THE DRY AIR WHICH SIMPLIFIED THE INSPECTION TEST PROCESS BY DECREASING THE SF6 GAS USED AMOUNT

摘要

PURPOSE: An inspection test method and an apparatus of gas insulated switchgear using the dry air are provided to reduce purchasing costs of the SF6 gas by reducing the SF6 gas used amount, and enables an environment-friendly task. By greatly simplifying the inspection test process repeating the process of injecting and collecting the SF6 gas, the test cost and time are reduced.;CONSTITUTION: Set a vacuum status identical to the development condition in which a GIB of the implementation under test will be installed, and maintain the same environment condition of gas pressure in each GIB tester injecting the SF6 gas and dry air, in one atmospheric pressure. By raising the voltage in the dielectric strength and measuring each of the puncture voltage, changing the GIB gas pressure and increasing the voltage by using the same method, the puncture voltage at GIB for each test injecting the SF6 gas and dry air is measured(310). Repeating the measuring step in the same condition, the puncture voltage of the SF6 gas and dry air are measured, and a 50% F.O.V(Flash Over Voltage) is calculated by using the method noted based on the measured value(320). An applied voltage applied in the inspection test using the dry air is calculated(330) by using database converting into the equivalence by 50% F O. V. calculated for each pressure of the SF6 gas and dry air, and an electric field analysis program predetermined for each condition.;COPYRIGHT KIPO 2013;[Reference numerals] (310) Measuring SF6 gas and dry air breakdown voltage; (320) Calculating 50% F.O.V; (330) Calculating applied voltage in the inspection test using the dry air; (340) Verifying the applied voltage in the inspection test using the dry air I; (350) Verifying the applied voltage in the inspection test using the dry air II; (AA) 0-4 atmospheric pressure, 1kV increase/minute; (BB) Using database converted into the equivalence by 50% F.O.V and an electric field analysis program; (CC) Attaching foreign substances after examining an electric field analysis by GIB part; (DD) Brain impulse test(up&down method, 5kV increase);