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How to positioning in the collision-free micro-manipulation tools

机译:如何在无碰撞的微操纵工具中定位

摘要

This invention is the method of doing positioning for the sample carrier of the micro operation tool in collisionless making use of the microscope, focus position Z of the particular point P P is calculated a) by adjusting the focus of the microscope object glass which possesses 1st numerical aperture NA1 at least to one point P of the sample carrier surface, b) the micro operation tool is positioned on the optical axis of the microscope, focus position Z of c) micro operation tool M the microscope object glass or the focus of the 2nd microscope object glass which smaller 2nd numerical aperture than as much as 1st numerical aperture NA1 NA2 possesses microIt seeks by adjusting to the point of the operation tool, d) considers specified allowance profile z and fall distance Z A (P) it calculates Z A (P) =Z with M Z P Z, z= z M+ Z P and z M, z P when calculating the respective operation tool or the position of the sample carrier, is specified allowance here, e) fall distance Z A (just P) makes the micro operation tool fall and positions in the point P.
机译:本发明是利用显微镜在无碰撞的情况下对微操作工具的样品载体进行定位的方法,通过调整焦点的位置来计算特定点P P 的焦点位置Z。至少在样品载体表面的一个点P上具有第一个数值孔径NA 1 的显微镜物镜,b)显微操作工具位于显微镜的光轴上,聚焦位置Z为c)微型操作工具 M 显微镜物镜或第二显微镜物镜的焦点,其第二数值孔径小于第一数值孔径NA 1 NA 2 拥有microIt,它通过调整到操作工具的点来寻找,d)考虑到指定的容差曲线z和下降距离Z A (P),它计算Z A (P)= Z和 MZPZ ,z = z M + ZP 和z M ,z P 计算相应的操作工具或样品架的位置在此处指定了余量,e)落下距离Z A (正好是P)使微型操作工具落下并定位在点P上。

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