首页> 外国专利> PROBE OF ATOMIC-FORCE MICROSCOPE WITH NANOCOMPOSITE RADIATING ELEMENT DOPED BY QUANTUM POINTS AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

PROBE OF ATOMIC-FORCE MICROSCOPE WITH NANOCOMPOSITE RADIATING ELEMENT DOPED BY QUANTUM POINTS AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

机译:量子点和核壳结构的磁性纳米粒子掺杂的纳米复合晶格元素构成的原子力显微镜

摘要

FIELD: measuring devices.;SUBSTANCE: invention relates to measurement equipment and can be used in scanning probe microscopy and atomic force microscopy for diagnosing and studying of nano-sized structures. This invention consists in fact that magnet transparent cantilever is connected with magnet transparent exploring needle, which top is connected with magnet transparent sphere made from glass with through nanometer pores of small and large diameter, filled with quantum points of nucleus-shell and magnetic particles of core-shell structure respectively.;EFFECT: enabling simultaneous combination of magnetic, thermal and electromagnetic point effect in optical wave range with measurement of mechanical response to this stimulating effect in one common point of surface of diagnosed object without impacting neighboring sections.;2 cl, 2 dwg
机译:技术领域本发明涉及测量设备,并且可以用于扫描探针显微镜和原子力显微镜以用于诊断和研究纳米尺寸的结构。实际上,本发明包括将磁铁透明的悬臂与磁铁透明的探针相连,其顶部与玻璃制成的磁铁透明球相连,所述玻璃由具有大小和直径的纳米孔的纳米管构成,并填充有核壳的量子点和磁性粒子。效果:使光波范围内的磁,热和电磁点效应与在被诊断物体表面的一个公共点测量对该刺激效应的机械响应同时结合,而不会影响相邻部分。2cl ,2载重吨

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