首页> 外国专利> PROBE OF ATOMIC-FORCE MICROSCOPE WITH NANOCOMPOSITE RADIATING ELEMENT DOPED BY QUANTUM POINTS AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

PROBE OF ATOMIC-FORCE MICROSCOPE WITH NANOCOMPOSITE RADIATING ELEMENT DOPED BY QUANTUM POINTS AND MAGNETIC NANOPARTICLES OF CORE-SHELL STRUCTURE

机译:量子点和核壳结构的磁性纳米粒子掺杂的纳米复合晶格元素构成的原子力显微镜

摘要

FIELD: measuring devices.;SUBSTANCE: invention relates to measurement equipment and can be used in scanning probe microscopy and atomic force microscopy for diagnosing and studying of nano-sized structures. Invention consists in that magnetically transparent cantilever is connected with electroconductive magnetically transparent probing needle, top of which is passed through magnetically transparent sphere made from glass with through nanometer pores of small and large diameter, filled with respectively quantum points of nucleus-shell and magnetic particles of core-shell structure.;EFFECT: enabling simultaneous combination of magnetic, thermal and electromagnetic wave in optical range point effect with measurement of characteristics of electric signal to this stimulating effect in one common point of surface of diagnosed object without impacting neighbouring sections.;1 cl, 2 dwg
机译:技术领域本发明涉及测量设备,并且可以用于扫描探针显微镜和原子力显微镜以用于诊断和研究纳米尺寸的结构。本发明的特征在于,将磁性透明的悬臂与导电的磁性透明探测针连接,该探针的顶部穿过由玻璃制成的磁性透明球体,该玻璃体具有小直径和大直径的纳米孔,分别填充有核壳和磁性粒子的量子点。效果:使光学范围点效应中的电磁波,热波和电磁波同时结合,并在不影响相邻部分的情况下,在被诊断物体的一个公共点上测量电信号的特性,以达到这种刺激效果。 1厘升,2载重吨

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