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X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT INTERFEROMETER SYSTEM

机译:X射线TALBOT干涉仪和X射线TALBOT干涉仪系统

摘要

The present invention relates to an X-ray Talbot interferometer including a source grating including a plurality of X-ray transmitting portions, configured to allow some of X-rays from an X-ray source to pass therethrough; a beam splitter grating having a periodic structure, configured to diffract X-rays from the X-ray transmitting portions by using the periodic structure to form an interference pattern; and an X-ray detector configured to detect X-rays from the beam splitter grating. The beam splitter grating diffracts an X-ray from each of the plurality of X-ray transmitting portions to form interference patterns each corresponding to one of the plurality of X-ray transmitting portions. The plurality of X-ray transmitting portions are arranged so that the interference patterns, each corresponding to one of the plurality of X-ray transmitting portions, are superimposed on one another to enhance a specific spatial frequency component in a sideband generated by modulation of the interference patterns.
机译:X射线塔尔博特干涉仪技术领域本发明涉及一种X射线Talbot干涉仪,该X射线Talbot干涉仪包括具有多个X射线透射部的源光栅,该源光栅被配置为允许来自X射线源的X射线中的一部分通过。具有周期性结构的分束光栅,被配置为通过使用所述周期性结构来衍射来自X射线透射部分的X射线以形成干涉图案; X射线检测器被配置为检测来自分束器光栅的X射线。分束光栅使来自多个X射线透射部分中的每个的X射线衍射,以形成分别对应于多个X射线透射部分中的一个的干涉图案。布置多个X射线透射部分,使得每个与多个X射线透射部分之一相对应的干涉图案彼此叠加,以增强通过调制调制产生的边带中的特定空间频率分量。干扰模式。

著录项

  • 公开/公告号EP3105763B1

    专利类型

  • 公开/公告日2019-09-11

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号EP20150710011

  • 发明设计人 HANDA SOICHIRO;

    申请日2015-02-12

  • 分类号G21K1/02;A61B6;G01N23/20;

  • 国家 EP

  • 入库时间 2022-08-21 12:31:34

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