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Synchrotron x-ray reflectivity study of oxidation/passivation of copper and211 silicon

机译：同步辐射X射线反射率研究铜和211硅的氧化/钝化

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Synchrotron x-ray-scattering technique studies of copper and silicon211u001eelectrochemical interfaces are reported. These two examples illustrate the 211u001eapplication of synchrotron x-ray techniques for oxidation, passivation, and 211u001edissolution of metals and semiconductors.

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作者
Chu, Y.; Nagy, Z.; Parkhutik, V.; You, H.;
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年度 1999
页码 1-9
总页数 9
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Copper; Oxidation; Silicon; Synchrotron radiation; Dissolution; Passivation; 211 Interfaces; X-ray diffraction;

机译：铜;氧化;硅;同步辐射;溶解;钝化; 211界面; X射线衍射;

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1. Synchrotron radiation X-ray reflectivity measurements of CVD-silicon oxide film treated by radical oxidation [J] . Kazumasa Kawase, Masao Inoue, Yasushi Uehara, 電子情報通信学会技術研究報告. シリコン材料·デバイス. Silicon Devices and Materials . 2003,第373期

机译：自由基氧化处理的CVD-氧化硅膜的同步辐射X射线反射率测量
2. Synchrotron radiation X-ray reflectivity measurements of CVD-silicon oxide film treated by radical oxidation [J] . Kazumasa Kawase, Masao Inoue, Yasushi Uehara, 電子情報通信学会技術研究報告. シリコン材料·デバイス. Silicon Devices and Materials . 2003,第373期

机译：通过自由基氧化处理CVD-氧化硅膜的同步辐射X射线反射率测量
3. The effects of silicon nitride and silicon oxynitride intermediate layers on the properties of tantalum pentoxide films on silicon: X-ray photoelectron spectroscopy, X-ray reflectivity and capacitance-voltage studies [J] . Passacantando M., Jolly F., Lozzi L., Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites . 2003,第1a3期

机译：氮化硅和氮氧化硅中间层对硅上五氧化钽薄膜性能的影响：X射线光电子能谱，X射线反射率和电容电压研究
4. In-situ synchrotron x-ray reflectivity studies of the passive oxides formation on iron and Fe-Cr alloy [C] . D.H.Kim, S.S.Kim, H.W.Jang, The Meeting of the Electrochemical Society . 2003

机译：原位同步X射线反射率研究铁和Fe-Cr合金的无源氧化物形成
5. Synchrotron X-Ray Scattering Studies of Complex Oxides [D] . Yu, Biqiong . 2019

机译：复合氧化物的同步X射线散射研究
6. Structural studies of the HIV-1 accessory protein Vpu in langmuir monolayers: synchrotron X-ray reflectivity. [O] . S Zheng, J Strzalka, C Ma, 2001

机译：Langmuir单层中HIV-1辅助蛋白Vpu的结构研究：同步加速器X射线反射率。
7. Studying Hemoglobin and a Bare Metal–Porphyrin Complex Immobilized on Functionalized Silicon Surfaces Using Synchrotron X-ray Reflectivity [O] . Rudra N. Samajdar, Chandan Kumar, P. Viswanath, 2019

机译：使用同步X射线反射率研究血红蛋白和固定在官能化硅表面上的裸金属 - 卟啉复合物

Synchrotron x-ray reflectivity study of oxidation/passivation of copper and211 silicon

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