Optical and morphological characterization of (ZnO)(x)(CdO)(1-x) thin films

摘要

The optical and morphological properties of (ZnO)(x)(CdO)(1-x) semiconductor thin films with x composition in the range 0 square x square 0.5 are studied by the photoluminescence optical technique (PL), and the Scanning Electron Microscopy (SEM). The evolution of the band associated with oxygen content in the films is observed and described as a function of the film composition and the thermal annealing. The surface morphology is presented, where two different binary semiconducting species can be discerned in proportions dependent on the films composition. [References: 5]