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首页> 外文期刊>Medical Physics >Determination of percentage depth-dose curves for electron beams using different types of detectors.
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Determination of percentage depth-dose curves for electron beams using different types of detectors.

机译:使用不同类型的检测器确定电子束的深度剂量曲线百分比。

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According to the new AAPM TG-51 dosimetry protocol, reference dosimetry for electron beams is performed at depth of d(ref)=0.6R50-0.1 (cm) instead of d(max) recommended in TG-21. In clinical practice most electron beams are normalized at d(max). Therefore it becomes more important to get an accurate percentage-depth-dose (%dd) curve particularly for higher-energy electron beams in which the depth d(ref) is away from d(max). When ionization chambers are used in determining %dd curves the water-to-air stopping-power ratios and the fluence correction factors are required. The TG-51 recommends that the stopping-power ratios for realistic electron beams be used instead of the monoenergetic stopping-power ratios used in TG-21. This investigation aims to study the effects of those correction factors on the determination of %dd curves. We observed 1% deviations in the value of %dd at d(ref) for 15 and 18 MeV beams between a plane-parallel NACP and a cylindrical IC-10 chamber without considering the fluence correction factors P(fl). We explored a method to derive the fluence correction factors at any depth by using the existing fluence correction data at d(max) and tested its feasibility. We compared %dd curves measured by a diode detector and a NACP chamber with stopping-power ratios recommended by TG-51 and those recommended by TG-21. We found that for 15 and 18 MeV beams the difference in the values of %dd at d(ref) between using those two different stopping-power ratios is about 0.5%. Excellent agreement is found between %dd curves measured by the diode and by the NACP chamber when the stopping-power ratios recommended by TG-51 are used.
机译:根据新的AAPM TG-51剂量学协议,电子束的参考剂量学是在d(ref)= 0.6R50-0.1(cm)的深度而不是TG-21中建议的d(max)进行的。在临床实践中,大多数电子束在d(max)处归一化。因此,获得准确的深度百分比剂量曲线(%dd)变得尤为重要,特别是对于深度d(ref)远离d(max)的高能电子束而言。当使用电离室确定%dd曲线时,需要水对空气的停止功率比和注量校正因子。 TG-51建议使用实际电子束的停止功率比,而不要使用TG-21中使用的单能停止功率比。这项研究旨在研究这些校正因子对%dd曲线确定的影响。对于平面平行NACP和圆柱形IC-10腔之间的15和18 MeV光束,我们在d(ref)处的%dd值出现了1%的偏差,而没有考虑注量校正因子P(fl)。我们探索了一种方法,该方法可以使用现有的d(max)能量密度校正数据推导任何深度的能量密度校正因子,并测试了其可行性。我们将二极管检测器和NACP室测得的%dd曲线与TG-51和TG-21推荐的停止功率比进行了比较。我们发现,对于15和18 MeV光束,使用这两种不同的停止功率比时,d(ref)处的%dd值之差约为0.5%。当使用TG-51推荐的停止功率比时,二极管和NACP室测得的%dd曲线之间存在极好的一致性。

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