首页> 外文期刊>Ferroelectrics >Compatibility of Material Processing and Fabrication of Sol-Gel Derived PZT Based Devices
【24h】

Compatibility of Material Processing and Fabrication of Sol-Gel Derived PZT Based Devices

机译:溶胶-凝胶衍生的PZT基器件的材料加工和制造兼容性

获取原文
获取原文并翻译 | 示例
           

摘要

This study investigates the compatibility of material processing and fabrication of micro devices based on sol-gel derived lead zirconate titanate (PZT) thin films. High temperature annealing of sol-gel derived PZT may cause cracking and diffusion of structure layers. The introduction of a buffer layer, (LaxSr_(1-x))MnO_3, between PZT thin film and metal electrodes improves PZT crystallization andferroelectricity. Annealing temperature of PZT/LSMO structure using furnace heating is investigated and compared with CO_2 laser annealing. A parameter study of PZT poling shows the improvement of film properties. The fabrication procedures of two exemplar devices, a micro accelerometer and a FPW acoustic sensor illustrate the interaction issues among material structures and processes.
机译:这项研究调查了基于溶胶-凝胶衍生的钛酸锆钛酸铅(PZT)薄膜的微器件的材料加工和制造的兼容性。溶胶-凝胶衍生的PZT的高温退火可能会导致结构层破裂和扩散。在PZT薄膜和金属电极之间引入(LaxSr_(1-x))MnO_3缓冲层可改善PZT结晶和铁电性。研究了采用炉加热的PZT / LSMO结构的退火温度,并将其与CO_2激光退火进行了比较。 PZT极化的参数研究显示了膜性能的改善。两个样例设备,微型加速度计和FPW声传感器的制造过程说明了材料结构和工艺之间的相互作用问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号