Reliability Analysis of Gamma Interconnection Network Systems

摘要

Gamma Interconnection Network (GIN) is a type of Multistage Interconnection Network (MIN) that consists of layers of switching elements connected together in a predefined topology providing the connectivity between the set of processors and the set of memory modules. GIN is constructed by 1x3, 3x3 and 3x1 switching elements. In this paper, network reliability of four other different types of Gamma hybrid networks namely Monogamma Interconnection Network (MGIN), Reliable Gamma Interconnection Network (REGIN), Cyclic Gamma Interconnection Network (CGIN) and Extra Stage Gamma Network (ESGN) are analyzed. The results from the proposed simulation method show that the ESGN, CGIN and REGIN exhibit high network reliability performance. This is subsequently followed by the MGIN, with a marginal network reliability improvement compared to the GIN. It is also shown that the reliability model used for simulation closely approximates the exact network reliability of MGIN, CGIN, and REGIN.