首页> 外文期刊>Journal of the mechanical behavior of biomedical materials >Defect formation in thin polyelectrolyte films on polycrystalline NiTi substrates.
【24h】

Defect formation in thin polyelectrolyte films on polycrystalline NiTi substrates.

机译:多晶硝基底物上薄的聚电解质薄膜中的缺陷形成。

获取原文
获取原文并翻译 | 示例
           

摘要

This paper reports on the mechanical properties of ultrathin PAA/PAH (polyacrylic acid/polyallylamine hydrochloride) polyelectrolyte films deposited by a layer-by-layer technique on a polycrystalline Nickel-Titanium (NiTi) substrate. Since thin polyelectrolyte films are potentially suitable coatings to reduce the Ni release in biomedical applications, the mechanical properties of the thin films were determined by applying monotonic and cyclic tensile strains of 5% and 3%, respectively. While single tensile strains up to 5% revealed the amazing strain to failure of the applied coating, cyclic strains resulted in defect formation within the polyelectrolytes. To provide a better understanding of the mechanisms that are determining the defect formation, macroscopic and microscopic defect localizations were determined by digital image correlation-and EBSD (electron back-scattered diffraction)-techniques. Defects emerged particularly within areas of elevated local strain differences and were predominantly observed in the vicinity of grain boundaries. To relate these findings to the transformation behavior of polycrystalline NiTi considering strain localizations and intergranular constraints, crystallographic data obtained from the EBSD measurements were correlated with the defect distribution. EBSD data revealed a distinct dependence of defect formation on misorientation of neighboring grains.
机译:本文报告了通过层型技术在多晶镍 - 钛(NITI)底物上沉积的超薄PAA / PAH(聚丙烯酸/聚烯烃盐酸盐)聚电解质膜的机械性能。由于薄的聚电解质膜是可能合适的涂层,以减少生物医学应用中的Ni释放,因此通过施加5%和3%的单调和环状拉伸菌株来确定薄膜的机械性能。虽然单个拉伸菌株高达5%,但透露涂覆涂层的失效令人惊叹的菌株,环状菌株导致聚电解质内的缺陷形成。为了更好地理解确定缺陷地层的机制,通过数字图像相关 - 和EBSD(电子背散射衍射)确定宏观和微观缺陷局部。特别是在局部应变差异升高的区域内出现的缺陷,主要在晶界附近观察到。为了将这些发现与考虑应变局部提出和晶间约束的多晶NITI的转化行为相关,从EBSD测量获得的晶体学数据与缺陷分布相关。 EBSD数据揭示了缺陷形成对邻近谷物的杂乱无章的独特依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号