...
首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >An investigation in to the impact of Ti doping on the structural, optical and sensing properties of spray deposited nanocrystalline ZrO2 thin films
【24h】

An investigation in to the impact of Ti doping on the structural, optical and sensing properties of spray deposited nanocrystalline ZrO2 thin films

机译:Ti掺杂对喷雾沉积纳米晶ZrO2薄膜结构,光学和感测性能影响的研究

获取原文
获取原文并翻译 | 示例
           

摘要

Pure and Ti doped ZrO2 thin films were prepared by chemical spray pyrolysis method on a glass substrate at 450 degrees C. XRD results reveal that pure and doped films had polycrystalline structure in nature with tetragonal phase and highly oriented along (011) plane. The crystallite size was increased with increasing Ti content from 17.6 nm to 25.3 nm. SEM images of ZrO2 and ZrO2:Ti thin films showed that the surface seems relatively homogeneous, and the EDX spectra confirm the stoichiometry of the prepared films. AFM measurements showed that the average roughness values were increased after doping with Ti. Optical transmittance of the deposited films high value was about (50%) and decreased with increasing of dopant concentration. The optical band gap decreased from 4.30 eV to 3.01 eV with increasing of Ti content. The ZrO2 and ZrO2:Ti (8%) thin films were investigated as NO2 gas sensor, the results showed a maximum response was at 250 degrees C and had a stable behavior for detecting NO2 gases. The doped ZrO2 film illustrated a higher response than that of the pure film. The sensing mechanism was modeled according to the oxygen-vacancy mode. (C) 2018 Elsevier GmbH. All rights reserved.
机译:通过在450℃的玻璃基板上通过化学喷雾热解方法制备纯和Ti掺杂的ZrO2薄膜。XRD结果表明,纯和掺杂的薄膜与四方相的多晶结构具有多晶结构,并且沿(011)平面高度取向。随着17.6nm至25.3nm的Ti含量增加,微晶尺寸增加。 ZrO2和ZrO2的SEM图像:Ti薄膜显示表面似乎相对均匀,EDX光谱确认制备薄膜的化学计量。 AFM测量表明,用Ti掺杂后,平均粗糙度值增加。沉积膜的光学透射率高值约为(50%),随着掺杂剂浓度的增加而降低。随着Ti含量的增加,光带间隙从4.30eV降低到3.01eV。研究了ZrO2和ZrO2:Ti(8%)薄膜作为NO 2气体传感器,结果显示出最大响应为250℃,并且具有检测NO2气体的稳定行为。掺杂的ZrO2膜示出了比纯膜的响应更高。根据氧空位模式进行建模的传感机制。 (c)2018年Elsevier GmbH。版权所有。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号