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首页> 外文期刊>Journal of nanoscience and nanotechnology >Study of Low Resistivity and High Work Function ITO Films Prepared by Oxygen Flow Rates and N_2O Plasma Treatment for Amorphous/Crystalline Silicon Heterojunction Solar Cells
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Study of Low Resistivity and High Work Function ITO Films Prepared by Oxygen Flow Rates and N_2O Plasma Treatment for Amorphous/Crystalline Silicon Heterojunction Solar Cells

机译:氧气流量和N_2O等离子体处理非晶态/晶体硅异质结太阳能电池低阻高功函数ITO薄膜的研究

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摘要

Pulsed DC magnetron sputtered indium tin oxide (ITO) films deposited on glass substrates with lowest resistivity of 2.62 × 10~(-4) Ω · cm and high transmittance of about 89% in the visible wavelength region. We report the enhancement of ITO work function (Φ_(ITO)) by the variation of oxygen (O_2) flow rate and N_2O surface plasma treatment. The Φ_(ITO) increased from 4.43 to 4.56 eV with the increase in O_2 flow rate from 0 to 4 sccm while surface treatment of N_2O plasma further enhanced the ITO work function to 4.65 eV. The crystallinity of the ITO films improved with increasing O_2 flow rate, as revealed by XRD analysis. The ITO work function was increased by the interfacial dipole resulting from the surface rich in O~- ions and by the dipole moment formed at the ITO surface during N_2O plasma treatment. The ITO films with high work functions can be used to modify the front barrier height in heterojunction with intrinsic thin layer (HIT) solar cells.
机译:脉冲直流磁控溅射溅射铟锡氧化物(ITO)膜沉积在玻璃基板上,其最低电阻率为2.62×10〜(-4)Ω·cm,在可见波长范围内的透射率约为89%。我们报告通过改变氧气(O_2)流量和N_2O表面等离子体处理来增强ITO功函数(Φ_(ITO))。随着O_2流量从0到4 sccm的增加,Φ_(ITO)从4.43 eV增加到4.56 eV,而N_2O等离子体的表面处理进一步将ITO功函数提高到4.65 eV。 XRD分析表明,随着O_2流量的增加,ITO薄膜的结晶度提高。 ITO功函数通过富含O-离子的表面产生的界面偶极子以及在N_2O等离子体处理过程中在ITO表面形成的偶极矩而增加。具有高功函数的ITO膜可用于修改本征薄层(HIT)太阳能电池异质结中的前势垒高度。

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