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首页> 外文期刊>Journal of the Instrument Society of India: Proceedings of the national symposium on instrumentation >DEVELOPMENT OF HIGH TEMPERATURE PC BASED FOUR-PROBE ELECTRICAL CONDUCTIVITY MEASUREMENT SETUP
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DEVELOPMENT OF HIGH TEMPERATURE PC BASED FOUR-PROBE ELECTRICAL CONDUCTIVITY MEASUREMENT SETUP

机译:基于高温PC的四探针电导率测量装置的开发

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摘要

An electrical conductivity measurement setup for measuring conductivity of solid sample pellets from room temperature to 1173 K in air or any other controlled atmosphere has been designed and developed. The four- probe technique is used for measuring the electrical conductivity. A constant current source which can deliver the current in the range of 0-500 mA, forces a fixed value of current through the sample. The sample is then heated with a programmable temperature controller at a required rate. The individual measuring circuit, measures the sample current, voltage drop between two fixed points of the sample and the sample temperature. These signals are then fed to the data acquisition system having microcontroller based hardware and windows based software, which is designed and fabricated in-house for continuously acquiring data. By knowing the voltage, current and dimensions of the sample pellet, the electrical conductivity of the sample is calculated at different temperatures.
机译:设计并开发了一种电导率测量装置,用于测量从室温到1173 K的空气或任何其他受控气氛中的固体样品颗粒的电导率。四探针技术用于测量电导率。恒流源可提供0-500 mA范围内的电流,从而迫使固定值的电流通过样品。然后用可编程的温度控制器以所需的速率加热样品。单独的测量电路可测量样品电流,样品两个固定点之间的电压降以及样品温度。这些信号然后被馈送到具有基于微控制器的硬件和基于Windows的软件的数据采集系统,该系统是在内部设计和制造的,用于连续采集数据。通过了解样品颗粒的电压,电流和尺寸,可以在不同温度下计算出样品的电导率。

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