首页> 外国专利> SEEBECK COEFFICIENT AND ELECTRICAL CONDUCTIVITY MEASUREMENT SYSTEM FOR MEASURING SEEBECK COEFFICIENT AND ELECTRICAL CONDUCTIVITY AT HIGH TEMPERATURE

SEEBECK COEFFICIENT AND ELECTRICAL CONDUCTIVITY MEASUREMENT SYSTEM FOR MEASURING SEEBECK COEFFICIENT AND ELECTRICAL CONDUCTIVITY AT HIGH TEMPERATURE

机译:用于测量高温的塞贝克系数和电导率的塞贝克系数和电导率测量系统

摘要

PURPOSE: A seebeck coefficient and electrical conductivity measurement system is provided to measure a current applied to a sub-heater at the high temperature by forming a sample holder with alumina and forming the sub-heater with a platinum wire. CONSTITUTION: A tube(4) is inserted into an inside of an electric furnace. A sample is inserted into an inside of the tube in order to measure a seebeck coefficient and electrical conductivity thereof. A vacuum cap(6,8) is installed at both ends of the tube in order to form vacuum and gas atmosphere. A sample holder(10) is installed in the inside of the vacuum cap. The sample is inserted into the sample holder. The sample holder is inserted into the inside of the tube.
机译:目的:提供塞贝克系数和电导率测量系统,以通过用氧化铝形成样品架并用铂丝形成子加热器来测量在高温下施加到子加热器的电流。构成:将一根管子(4)插入电炉的内部。将样品插入管的内部以便测量塞贝克系数及其电导率。真空帽(6,8)安装在管的两端,以形成真空和气体气氛。样品架(10)安装在真空盖的内部。将样品插入样品架。将样品架插入试管内部。

著录项

  • 公开/公告号KR20040110241A

    专利类型

  • 公开/公告日2004-12-31

    原文格式PDF

  • 申请/专利权人 HANYANG HAK WON CO. LTD.;

    申请/专利号KR20030039458

  • 发明设计人 SIM GWANG BO;KIM GYEONG HUN;

    申请日2003-06-18

  • 分类号G01R29/24;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:19

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