首页> 外文期刊>Journal of the Instrument Society of India: Proceedings of the national symposium on instrumentation >Programmable XY translation stage with GPIB interface for time resolved measurements on semiconductor structures
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Programmable XY translation stage with GPIB interface for time resolved measurements on semiconductor structures

机译:具有GPIB接口的可编程XY平移台,用于对半导体结构进行时间分辨的测量

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摘要

In this paper, we have described our work to obtain programmable optical delay using computer control of a x-y translation stage and a GPIB interface. Results of a typical time resolved measurement of luminescence in a semiconductor obtained using our set up is presented.
机译:在本文中,我们描述了使用计算机控制x-y平移台和GPIB接口来获得可编程光学延迟的工作。给出了使用我们的设置获得的半导体中典型的时间分辨发光测量结果。

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