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Microfabrication of Micro-Conductive Patterns on Insulating Substrate by Electroless Nickel Plating

机译:化学镀镍在绝缘基板上微细加工导电图形

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摘要

Micro-conductive patterns were microfabricated on an insulating substrate (SiO_2) surface by a selective electroless nickel plating process in order to investigate tbe formation of seed layers. To fabricate micro-conductive patterns, a thin layer of metal (Cu,Cr) was deposited in the desired micropattern using laser-induced forward transfer (LIFT), and above this layer, a second layer was plated by selective electroless plating. The LIFT process, which was carried out in multi-scan mode, was used to fabricate micro-conductive patterns via electroless nickel plating. This method helps to improve the deposition process for forming seed patterns on the insulating substrate surface and the electrical conductivity of the resulting patterns. This study analyzes the effect of seed pattern formation by LIFT and key parameters in electroless nickel plating during micro-conductive pattern fabrication. The effects of the process variables on the cross-sectional shape and surface quality of the deposited patterns are examined using field emission scanning electron microscopy (FE-SEM) and an optical microscope.
机译:为了研究种子层的形成,通过选择性化学镀镍工艺在绝缘衬底(SiO_2)表面上微制造了微导电图案。为了制造微导电图案,使用激光诱导的正向转移(LIFT)在所需的微图案中沉积一层金属(Cu,Cr)薄层,然后在该层上方通过选择性化学镀镀第二层。在多扫描模式下进行的LIFT工艺用于通过化学镀镍制造微导电图案。该方法有助于改善在绝缘基板表面上形成种子图案的沉积工艺以及所得图案的电导率。本研究分析了通过LIFT形成晶种图案以及在微导电图案制造过程中化学镀镍中的关键参数的影响。使用场发射扫描电子显微镜(FE-SEM)和光学显微镜检查工艺变量对沉积图案的横截面形状和表面质量的影响。

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