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Efficient CVD diamond film/alumina composite substrate for high density electronic packaging application

机译:用于高密度电子封装应用的高效CVD金刚石薄膜/氧化铝复合基材

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摘要

Due to its extreme hardness, chemical and mechanical stability, large band gap, low dielectric constant and highest thermal conductivity, diamond film is expected to be an excellent electronic packaging material for high frequency and high power devices. Under an alcohol concentration of 0.8 percent and a substrate temperature of 850 deg C, high quality diamond films deposited on alumina are obtained by hot filament chemical vapor deposition (HFCVD) method using the optimum parameters determined by an infrared spectroscopic ellipsometer. Prior to the deposition of diamond film, carbon ions are implanted into alumina wafers to release the residual stress between interfaces. The measurement results indicate that dielectric properties and the thermal conductivity of diamond film/alumina composites are improved further with the increase of diamond coating. When the thickness of diamond coating is up to 100 mu m, dielectric constant and dielectric loss of diamond film/alumina composite are 6.5 and 1.1 X 10~(-3), respectively. However, a thermal conductivity of 3.98 W/cm-K is obtained.
机译:由于其极高的硬度,化学和机械稳定性,大的带隙,低的介电常数和最高的导热性,金刚石薄膜有望成为用于高频和高功率设备的出色电子封装材料。在酒精浓度为0.8%且基材温度为850℃的条件下,使用红外光谱椭圆偏振仪确定的最佳参数,通过热丝化学气相沉积(HFCVD)方法获得沉积在氧化铝上的高质量金刚石薄膜。在沉积金刚石膜之前,将碳离子注入到氧化铝晶片中以释放界面之间的残余应力。测量结果表明,金刚石膜/氧化铝复合材料的介电性能和导热系数随着金刚石涂层的增加而进一步提高。当金刚石涂层的厚度达到100μm时,金刚石膜/氧化铝复合材料的介电常数和介电损耗分别为6.5和1.1×10 3-(-3)。然而,获得了3.98W / cm-K的热导率。

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