Precision Capacitance‐Conductance Bridge for Dielectric Measurements at Audio and Low Radio Frequencies

摘要

An inductively coupled ratio arm bridge for accurate measurement of the dielectric properties of materials at frequencies from 1 to 100 kc is described. Errors in the determination of very low loss tangents dependent on stray capacitance and nonideal ratio arm characteristics are discussed, and ways of decreasing them outlined. Design and performance data for the bridge are given.