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首页> 外文期刊>Journal of Crystal Growth >Optimization of growth conditions for InGaAs/InAlAs/InP quantum cascade lasers by metalorganic chemical vapor deposition
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Optimization of growth conditions for InGaAs/InAlAs/InP quantum cascade lasers by metalorganic chemical vapor deposition

机译:金属有机化学气相沉积法优化InGaAs / InAlAs / InP量子级联激光器的生长条件

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摘要

We investigate the growth conditions for lattice-matched InGaAs/InAlAs/InP quantum cascade lasers (QCLs) by metalorganic chemical vapor deposition (MOCVD). Effect of substrate misorientation, growth temperature, and V/III ratios of InGaAs and InAlAs layers on the surface morphology, optical quality, and impurity incorporation were systematically studied. It was found that epitaxial layers and multi-quantum-well structures grown at 720 °C with V/III ratios of 116 for InGaAs and 21 for InAlAs on InP substrates with an off-cut angle of ~0.06° exhibit a stable step-flow growth and low oxygen and carbon contamination. Using these conditions, a ~ 11.3-um-thick QCL with an emission wavelength at ~9.2 urn was grown and fabricated, which demonstrated excellent structural quality and operated at room temperature in pulsed mode with a threshold current density of 2.0 kA/cm2 and a slope efficiency of 550 mW/A.
机译:我们通过金属有机化学气相沉积(MOCVD)研究晶格匹配的InGaAs / InAlAs / InP量子级联激光器(QCL)的生长条件。系统研究了衬底取向错误,生长温度以及InGaAs和InAlAs层的V / III比对表面形貌,光学质量和杂质掺入的影响。发现在截止角为约0.06°的InP衬底上,在720°C时生长的外延层和多量子阱结构,InGaAs的V / III比为116,InAlAs的V / III比为21,表现出稳定的阶跃流生长和低氧和碳污染。在这些条件下,生长并制造出了一个约11.3um厚的QCL,其发射波长为〜9.2 urn,这证明了优异的结构质量,并在室温下以脉冲模式工作,阈值电流密度为2.0 kA / cm2,斜坡效率为550 mW / A。

著录项

  • 来源
    《Journal of Crystal Growth》 |2011年第1期|p.75-80|共6页
  • 作者单位

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, CA 30332-0250, USA;

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, CA 30332-0250, USA;

    Center for Compound Semiconductors and School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Dr. NW, Atlanta, CA 30332-0250, USA,School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA;

    School of Engineering and Applied Sciences, Harvard University, 19 Oxford Street, Cambridge, MA 02138, USA;

    School of Engineering and Applied Sciences, Harvard University, 19 Oxford Street, Cambridge, MA 02138, USA;

    School of Engineering and Applied Sciences, Harvard University, 19 Oxford Street, Cambridge, MA 02138, USA;

    Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA;

    Department of Physics, Arizona State University, Tempe, AZ 85287-1504, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Characterization; A3. Metalorganic chemical vapor deposition; B2. Semiconducting III-V materials; B3. Infrared devices; B3. Laser diodes;

    机译:A1。表征;A3。金属有机化学气相沉积;B2。半导体III-V材料;B3。红外设备;B3。激光二极管;

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